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I. Cevdet Noyan

Faculty Photo
I. Cevdet Noyan
Professor
(office) 1120 S.W. Mudd
(mail) 200 S.W. Mudd, Mail Code: 4701
New York, NYY 10027

Phone: +1 212 854 8919
Email:


Research Specialty

Solid mechanics/micromechanics; x-ray and neutron diffraction/microdiffracton modeling; residual stress analysis.

I. C. Noyan has been studying the mechanical response of crystalline materials over various length scales since 1978. He was one of the first researchers to combine the theory of micromechanics with that of x-ray and neutron diffraction. He and his group also work on extending x-ray characterization techniques for bulk structures to microdomains, with particular emphasis on ULSI chip structures. They have designed and built a microdiffraction system based on focussing capillary optics and monochromatic radiation on the X-20 beamline of the Brookhaven National Laboratory, National Synchrotron Light Source (NSLS). It was successfully used to determine the evolution of stress gradients in electromigration structures at very low current densities It was also used to analyze dislocation distributions and lattice rotations in SiGe films on a local scale . The microbeam effort is now being extended to the quantification of finite size effects in thin film structures, and is being pursued at NSLS and the Advanced, Photon Source. From 2005 on Noyan has been a Co-principal investigator on the new X13B microbeam diffraction line that is being built at NSLS. This beamline is now operational and will be fully commissioned in 2008.

Education

Northwestern University, Evanstan IL
Materials Science and Engineering, Ph.D. 1984

Professional Experience

Columbia University, New York
  • Professor of Materials Science and Engineering (2004 - Present)
  • Adjunct Professor (1985 - 2004)

International Business Machines Corporation, Yorktown Heights, NY.
  • Research Consultant (2004 - Present)
  • Research Staff Member (1985 - 2004)

Northwestern University, Evanston, Il.
  • Postdoctoral Researcher (1983 - 1985)

Recent publications

1. Submicron mapping of strained silicon-on-insulator features induced by shallow-trench-isolation structures. Conal E. Murray, M. Sankarapandian, S. M. Polvino, I. C. Noyan, B. Lai, and Z. Cai, Appl. Phys. Lett. 90, 171919 (2007)

2. Diffraction profiles of elastically bent single crystals with constant strain gradients, Hanfei Yan, Ozgur Kalenci and I. C. Noyan, Journal of Applied, Crystallography, 322-333 (2007)

3. Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography Hanfei Yan, Conal E. Murray, and I. C. Noyan, Appl. Phys. Lett. 90, 091918 (2007)

4. Dynamical diffraction peak splitting in time-of-flight neutron diffraction, E. Üstündag, R. A. Karnesky, M. R. Daymond, and I. C. Noyan, Appl. Phys. Lett. 89, 233515 (2006)

5. Measurement of stress/strain in single-crystal samples using diffraction, Yan, H. & Noyan, I. C.. J. Appl. Cryst. 39, 320–325, (2006)

6. Thermal stress evolution in embedded Cu/low-k dielectric composite features, Conal E. Murray, Charles C. Goldsmith, Thomas M. Shaw, James P. Doyle, and I. C. Noyan, Appl. Phys. Lett. 89, 011913 (2006).

7. Structure of Zn–Se–Te system with sub-monolayer insertion of ZnTe grown by migration enhanced epitaxy, Y. Gong, Hanfei F. Yan, I. L. Kuskovsky, Y. Gu, I. C. Noyan, G. F. Neumark, and M. C. Tamargo, J. Appl. Phys. 99, 064913 (2006)

8. Mechanism for increasing dopant incorporation in semiconductors via doped nanostructures, Phys. Rev. B 73, 195306 (2006), Igor L. Kuskovsky, Y. Gu,2, Y. Gong, H. F. Yan, J. Lau, I. C. Noyan, G. F. Neumark, O. Maksimov, X. Zhou, M. C. Tamargo, V. Volkov, Y. Zhu, and L. Wang.

9. Dynamical diffraction artifacts in Laue microdiffraction images, Yan HF, Noyan IC, J. APP. PHYS. 98 (7), 2005

10. Mechanics of end effects in thin film and substrate stress distributions , Murray CE, Noyan IC, MAT. SCI. FORUM 490-491: 13-18, 2005

11. Flexural loading of rectangular Si beams and plates, Kaldor SK, Noyan IC , MAT. SCI. & ENG. A- 399, (1-2): 64-71, 2005

12. Spatially transient stress effects in thin films by X-ray diffraction, Murray CE, Goldsmith CC, Noyan IC , POWDER DIFFRACTION 20 (2): 112-116, 2005

13. Fourier analysis of X-ray micro-diffraction profiles to characterize laser shock peened metals

14. Chen HQ, Yao YL, Kysar JW, Noyan IC, Wang YN , INT. J. SOLIDS AND STRUCTURES 42 (11-12): 3471-3485, 2005

15. High-resolution strain mapping in heteroepitaxial thin-film features, Murray CE, Yan HF, Noyan IC, Cai Z, Lai B, J. APP. PHYS. 98 (1), 2005